ELECTRON MICROSCOPY

Sample

Complex of three bNAb 1-55 Fabs and three 10-1074 Fabs bound to RC1 variant of BG505 SOSIP.664 trimer

Specimen Preperation
Sample Aggregation State PARTICLE
Vitrification Instrument FEI VITROBOT MARK IV
Cryogen Name ETHANE
Sample Vitrification Details 0 blot force, 3.5 second blot time, 3 uL sample added to freshly glow-discharged grids
3D Reconstruction
Reconstruction Method SINGLE PARTICLE
Number of Particles 110126
Reported Resolution (Å) 3.9
Resolution Method FSC 0.143 CUT-OFF
Other Details ?
Refinement Type
Symmetry Type POINT
Map-Model Fitting and Refinement
ID 1
Refinement Space ?
Refinement Protocol RIGID BODY FIT
Refinement Target ?
Overall B Value ?
Fitting Procedure ?
Details ?
Data Acquisition
Detector Type FEI FALCON III (4k x 4k)
Electron Dose (electrons/Å2) 40
Imaging Experiment
Date of Experiment ?
Temprature (Kelvin)
Microscope Model FEI TALOS ARCTICA
Minimum Defocus (nm) 1000
Maximum Defocus (nm) 3400
Minimum Tilt Angle (degrees) ?
Maximum Tilt Angle (degrees) ?
Nominal CS 2.7
Imaging Mode BRIGHT FIELD
Specimen Holder Model FEI TITAN KRIOS AUTOGRID HOLDER
Nominal Magnification 73000
Calibrated Magnification ?
Source FIELD EMISSION GUN
Acceleration Voltage (kV) 200
Imaging Details ?
Imaging Experiment
Task Software Package Version
IMAGE ACQUISITION EPU ?
CTF CORRECTION Gctf ?
MODEL FITTING UCSF Chimera ?
INITIAL EULER ASSIGNMENT RELION ?
FINAL EULER ASSIGNMENT RELION ?
CLASSIFICATION RELION ?
RECONSTRUCTION RELION ?
MODEL REFINEMENT PHENIX ?
MODEL REFINEMENT Coot ?
Image Processing
CTF Correction Type CTF Correction Details Number of Particles Selected Particle Selection Details
PHASE FLIPPING AND AMPLITUDE CORRECTION ?