X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 298 0.1 M potassium thiocyanate, 30% (w/v) PEG 2000 MME
Unit Cell:
a: 25.690 Å b: 11.630 Å c: 28.930 Å α: 90.000° β: 139.577° γ: 90.000°
Symmetry:
Space Group: P 1 21/c 1
Crystal Properties:
Matthew's Coefficient: 1.51 Solvent Content: 18.70
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION AB INITIO PHASING FREE R-VALUE 1.10 16.66 3965 397 89.67 0.1284 0.1497 9.71
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.100 16.7 88.400 0.055 ? 21.910 6.012 ? 3969 ? ? 10.525
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.100 1.130 42.100 ? ? 9.450 3.932 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 24-ID-E 0.9792 APS 24-ID-E
Software
Software Name Purpose Version
XDS data reduction 20180126
XSCALE data scaling 20180126
PHENIX refinement v1.16
PDB_EXTRACT data extraction 3.25
SHELXD phasing .