X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.0 298 3.2 M ammonium sulfate, 0.1 M citrate pH 5.0
Unit Cell:
a: 12.580 Å b: 29.810 Å c: 15.260 Å α: 90.00° β: 94.21° γ: 90.00°
Symmetry:
Space Group: P 1 21/c 1
Crystal Properties:
Matthew's Coefficient: 1.54 Solvent Content: 20.17
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION AB INITIO PHASING THROUGHOUT 0.85 14.90 7989 799 80 ? 0.085 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
0.850 14.9 82.400 0.040 ? 22.810 6.251 ? 7989 ? ? 7.475
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 0.850 0.870 28.000 ? ? 5.280 2.724 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 24-ID-C 0.8856 APS 24-ID-C
Software
Software Name Purpose Version
SHELXT refinement 2018/3
XDS data reduction 20170601
XSCALE data scaling 20170601
PDB_EXTRACT data extraction 3.25
SHELXT phasing .