ISDA

X-RAY DIFFRACTION

Crystallization Details

Method	pH	Temprature	Details
X-RAY DIFFRACTION	9.0	293.15	Protein: 2.5 mg/ml NEGR1 in 10 mM HEPES, pH 8.0, 150 mM NaCl. Reservoir Solution: 20% (w/v) PEG 3350, 0.1 M Tris pH 9.0, 0.2 M MgCl2, 0.6 M NaI. Crystallization Drop: 1 micro-Liter NEGR1 + 1 micro-Liter Reservoir Solution Single crystals were obtained via microseeding, and their size improved to ~600 x 200 micro-meters by macroseeding. Crystals harvested from the crystallization drops were cryo-protected in reservoir solution containing 20% (v/v) MPD and then flash cooled by plunging into liquid nitrogen

Unit Cell:

a: 73.569 Å b: 97.218 Å c: 252.424 Å α: 90.000° β: 90.000° γ: 90.000°

Symmetry:

Space Group: C 2 2 21

Crystal Properties:

Matthew's Coefficient: 3.53 Solvent Content: 65.11

Refinement Statistics

Diffraction ID	Structure Solution Method	Cross Validation Method	Resolution Limit (High)	Resolution Limit (Low)	Number of Reflections (Observed)	Number of Reflections (R-free)	Percent Reflections (Observed)	R-Work	R-Free	Mean Isotropic
X-RAY DIFFRACTION	MOLECULAR REPLACEMENT	THROUGHOUT	3.01	31.81	14290	498	77.2900	0.2357	0.2856	62.6765

Data Collection

Overall

Resolution Limit (High)	Resolution Limit (Low)	Percent Possible (Observed)	R Merge I (Observed)	R Sym I (Observed)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
3.01	31.81	86.600	0.071	?	12.400	6.600	?	16011	?	?	?

Highest Resolution Shell

#	Resolution Limits (Low)	Resolution Limits (High)	Percent Possible (All)	Percent Possible (Observed)	R-Sym I (Observed)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1	3.010	3.060	50.200	?	?	?	4.100	?

Diffraction

Diffraction experiment

Crystal ID	Scattering Type	Data Collection Temprature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1		100 K			?

Radiation Source

Source	Type	Wavelength List	Synchrotron Site	Beamline
SYNCHROTRON	APS BEAMLINE 17-ID	1.00001	APS	17-ID

Software