X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.0 298 0.2 M ammonium sulfate, 0.1 M ammonium acetate pH 4.6 and 28% PEG MME 550
Unit Cell:
a: 150.190 Å b: 39.783 Å c: 56.499 Å α: 90.000° β: 108.940° γ: 90.000°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 2.64 Solvent Content: 53.35
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 2.1100 28.2070 33438 3340 93.9800 0.2142 0.2605 47.7687
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.110 50.000 94.000 0.085 ? 8.800 3.600 ? 33464 ? ? 35.580
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.110 2.150 71.600 ? ? ? 2.700 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU MICROMAX-007 HF 1.541 ? ?
Software
Software Name Purpose Version
HKL-2000 data reduction .
HKL-2000 data scaling .
SHELX phasing .
PHENIX refinement (1.12_2829: ???)
PDB_EXTRACT data extraction 3.25