ELECTRON MICROSCOPY

Sample

VSV L:P

Specimen Preperation
Sample Aggregation State PARTICLE
Vitrification Instrument ?
Cryogen Name ETHANE
Sample Vitrification Details ?
3D Reconstruction
Reconstruction Method SINGLE PARTICLE
Number of Particles 83979
Reported Resolution (Å) 3.0
Resolution Method FSC 0.143 CUT-OFF
Other Details Refinement and classification were limited to a resolution of 0.4 nm to produce unbiased resolution estimate at final estimate resolution.
Refinement Type
Symmetry Type POINT
Map-Model Fitting and Refinement
ID 1
Refinement Space REAL
Refinement Protocol OTHER
Refinement Target CC + restraints
Overall B Value 70.6
Fitting Procedure ?
Details ?
Data Acquisition
Detector Type GATAN K2 SUMMIT (4k x 4k)
Electron Dose (electrons/Å2) 100
Imaging Experiment
Date of Experiment ?
Temprature (Kelvin)
Microscope Model FEI TITAN KRIOS
Minimum Defocus (nm) ?
Maximum Defocus (nm) ?
Minimum Tilt Angle (degrees) ?
Maximum Tilt Angle (degrees) ?
Nominal CS ?
Imaging Mode BRIGHT FIELD
Specimen Holder Model ?
Nominal Magnification ?
Calibrated Magnification ?
Source FIELD EMISSION GUN
Acceleration Voltage (kV) 300
Imaging Details ?
Imaging Experiment
Task Software Package Version
CTF CORRECTION CTFFIND 4
MODEL FITTING O 14.0.0
INITIAL EULER ASSIGNMENT FREALIGN X
FINAL EULER ASSIGNMENT FREALIGN X
CLASSIFICATION FREALIGN X
RECONSTRUCTION FREALIGN X
MODEL REFINEMENT PHENIX 1.16-3549
Image Processing
CTF Correction Type CTF Correction Details Number of Particles Selected Particle Selection Details
PHASE FLIPPING AND AMPLITUDE CORRECTION CTF correction using cisTEM
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