X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.0 273 26% PEG6000, 0.01 M ZnCl2, 0.1 M MES pH=6.0
Unit Cell:
a: 138.500 Å b: 138.500 Å c: 138.500 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: P 43 3 2
Crystal Properties:
Matthew's Coefficient: 2.80 Solvent Content: 56.01
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.7200 46.1670 48609 2443 99.9900 0.1703 0.1953 38.5066
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.720 56.540 100.000 0.113 ? 31.600 77.100 ? 48671 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.720 1.760 100.000 ? ? 1.7 76.900 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON DIAMOND BEAMLINE I03 0.97625 Diamond I03
Software
Software Name Purpose Version
XDS data reduction .
Aimless data scaling 0.7.1
PHASER phasing 2.8.1
PHENIX refinement 1.15.2_3472
PDB_EXTRACT data extraction 3.25