ISDA

X-RAY DIFFRACTION

Crystallization Details

Method	pH	Temprature	Details
X-RAY DIFFRACTION	7.5	293	0.1 M KCl, 0.01 M MgCl2, 0.05 M HEPES pH 7.0, 5% v/v PEG 400 (Hampton Natrix crystal screen # 35)

Unit Cell:

a: 88.342 Å b: 88.342 Å c: 88.342 Å α: 90.000° β: 90.000° γ: 90.000°

Symmetry:

Space Group: P 2 3

Crystal Properties:

Matthew's Coefficient: 2.47 Solvent Content: 50.3

Refinement Statistics

Diffraction ID	Structure Solution Method	Cross Validation Method	Resolution Limit (High)	Resolution Limit (Low)	Number of Reflections (Observed)	Number of Reflections (R-free)	Percent Reflections (Observed)	R-Work	R-Free	Mean Isotropic
X-RAY DIFFRACTION	MOLECULAR REPLACEMENT	THROUGHOUT	2.1550	44.2100	12087	587	99.9700	0.2084	0.2341	36.1140

Data Collection

Overall

Resolution Limit (High)	Resolution Limit (Low)	Percent Possible (Observed)	R Merge I (Observed)	R Sym I (Observed)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
2.1550	51.00	100.0	0.127	?	17.2	10.6	?	12682	?	?	28.4

Highest Resolution Shell

#	Resolution Limits (Low)	Resolution Limits (High)	Percent Possible (All)	Percent Possible (Observed)	R-Sym I (Observed)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1	2.1550	2.22	100.0	?	?	2.0	10.7	?

Diffraction

Diffraction experiment

Crystal ID	Scattering Type	Data Collection Temprature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1		100 K			?

Radiation Source

Source	Type	Wavelength List	Synchrotron Site	Beamline
SYNCHROTRON	ESRF BEAMLINE ID29	0.9537	ESRF	ID29

Software