ELECTRON MICROSCOPY

Sample

AtNBR1-PB1 (S-type)

Specimen Preperation
Sample Aggregation State FILAMENT
Vitrification Instrument LEICA EM GP
Cryogen Name ETHANE
Sample Vitrification Details ?
3D Reconstruction
Reconstruction Method HELICAL
Number of Particles 18021
Reported Resolution (Å) 4.4
Resolution Method FSC 0.143 CUT-OFF
Other Details ?
Refinement Type
Symmetry Type HELICAL
Map-Model Fitting and Refinement
ID 1
Refinement Space REAL
Refinement Protocol FLEXIBLE FIT
Refinement Target Correlation coefficient
Overall B Value ?
Fitting Procedure ?
Details ?
Data Acquisition
Detector Type FEI FALCON II (4k x 4k)
Electron Dose (electrons/Å2) 14
Imaging Experiment
Date of Experiment ?
Temprature (Kelvin)
Microscope Model FEI TITAN KRIOS
Minimum Defocus (nm) 500
Maximum Defocus (nm) 4500
Minimum Tilt Angle (degrees) ?
Maximum Tilt Angle (degrees) ?
Nominal CS 2.7
Imaging Mode BRIGHT FIELD
Specimen Holder Model FEI TITAN KRIOS AUTOGRID HOLDER
Nominal Magnification 59000
Calibrated Magnification ?
Source FIELD EMISSION GUN
Acceleration Voltage (kV) 300
Imaging Details ?
Imaging Experiment
Task Software Package Version
PARTICLE SELECTION SPRING 0.85
IMAGE ACQUISITION SerialEM ?
CTF CORRECTION CTFFIND 4
MODEL FITTING PHENIX dev-3500
MODEL REFINEMENT PHENIX dev-3500
INITIAL EULER ASSIGNMENT SPRING 0.85
FINAL EULER ASSIGNMENT SPRING 0.85
CLASSIFICATION SPRING 0.85
RECONSTRUCTION SPRING 0.85
Image Processing
CTF Correction Type CTF Correction Details Number of Particles Selected Particle Selection Details
PHASE FLIPPING AND AMPLITUDE CORRECTION ?