X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8 292 2 M AS, 100 mM Tris-HCl
Unit Cell:
a: 155.980 Å b: 155.980 Å c: 181.750 Å α: 90.000° β: 90.000° γ: 120.000°
Symmetry:
Space Group: P 32 1 2
Crystal Properties:
Matthew's Coefficient: 5.84 Solvent Content: 78.93
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 2.0500 47.8400 157905 7895 99.8000 0.1860 0.1990 54.9500
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.05 47.84 99.9 0.102 ? 15.01 14.36 ? 157907 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.05 2.17 ? ? ? ? ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SOLEIL BEAMLINE PROXIMA 1 1 SOLEIL PROXIMA 1
Software
Software Name Purpose Version
BUSTER refinement 2.10.3
PDB_EXTRACT data extraction 3.25
XDS data reduction .
XSCALE data scaling .
SHELXCD phasing .