X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.5 295.15 2 mM divalents mix (0.5 mM MnCl3, 0.5 mM CoCl2, 0.5 mM NiCl2, 0.5 mM Zn(OAc)2, 0.1 M Buffer System 6, pH 8.5 (Gly-Gly, AMPD), and 50% precipitation Mix 7 (20 % PEG 8000, 40% 1,5-Pentanediol)
Unit Cell:
a: 57.327 Å b: 79.175 Å c: 94.417 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: C 2 2 21
Crystal Properties:
Matthew's Coefficient: 2.17 Solvent Content: 43.25
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD FREE R-VALUE 2.14 41.67 12101 635 99.22 0.2317 0.2748 73.65
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.14 46.43 99.6 0.031 ? 17.5 4.2 ? 12148 ? ? 59.97
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.14 2.2 98.1 ? ? 0.8 3.2 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ESRF BEAMLINE ID29 0.976 ESRF ID29
Software
Software Name Purpose Version
PHENIX refinement 1.17_3644
PHENIX refinement 1.17_3644
XDS data reduction .
Aimless data scaling .
PHENIX phasing .