ISDA

X-RAY DIFFRACTION

Crystallization Details

Method	pH	Temprature	Details
X-RAY DIFFRACTION	6.4	277.15	48% M1K3350 (12% w/v PEG 1000, 12% w/v PEG 3350, and 12% v/v MPD, original solution Molecular Dimensions), 1,25% NPS (3.75 mM sodium nitrate, 3.75 mM sodium phosphate dibasic, and 3.75 mM ammonium sulfate; original solution MolecularDimensions), 0.1M MMT buffer (pH 6.4) (0.02 M DL-malic acid, 0.04 M MES monohydrate, 0.04 M Tris)

Unit Cell:

a: 48.677 Å b: 48.677 Å c: 177.846 Å α: 90.000° β: 90.000° γ: 120.000°

Symmetry:

Space Group: P 31 2 1

Crystal Properties:

Matthew's Coefficient: 2.01 Solvent Content: 38.83

Refinement Statistics

Diffraction ID	Structure Solution Method	Cross Validation Method	Resolution Limit (High)	Resolution Limit (Low)	Number of Reflections (Observed)	Number of Reflections (R-free)	Percent Reflections (Observed)	R-Work	R-Free	Mean Isotropic
X-RAY DIFFRACTION	SAD	THROUGHOUT	1.604	42.155	28170	1433	83.3000	0.2190	0.2470	19.6700

Data Collection

Overall

Resolution Limit (High)	Resolution Limit (Low)	Percent Possible (Observed)	R Merge I (Observed)	R Sym I (Observed)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
1.604	42.155	85.100	0.215	0.215	11.900	19.100	?	28207	?	?	17.880

Highest Resolution Shell

#	Resolution Limits (Low)	Resolution Limits (High)	Percent Possible (All)	Percent Possible (Observed)	R-Sym I (Observed)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1	1.604	1.707	25.600	?	2.299	1.300	15.000	?

Diffraction

Diffraction experiment

Crystal ID	Scattering Type	Data Collection Temprature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1		100 K			?

Radiation Source

Source	Type	Wavelength List	Synchrotron Site	Beamline
SYNCHROTRON	SLS BEAMLINE X06DA	0.99999	SLS	X06DA

Software