X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5 293 200 mM ammonium chloride, 100 mM sodium acetate pH 5, 20 % PEG 6000
Unit Cell:
a: 24.620 Å b: 33.420 Å c: 84.940 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: P 2 2 21
Crystal Properties:
Matthew's Coefficient: 2.09 Solvent Content: 41.05
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION AB INITIO PHASING FREE R-VALUE 1.90 50 5952 ? 100 ? 0.271 43.78
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.90 50 100 ? 0.103 9.9 6.8 ? 5975 ? ? 40.8
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.90 1.95 100 ? 1.432 1.0 6.1 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON DIAMOND BEAMLINE I03 0.976 Diamond I03
Software
Software Name Purpose Version
PHENIX refinement .
XDS data reduction .
XSCALE data scaling .
AMPLE phasing .