X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 285 100 mM Mes pH 6.5 200 mM MgCl2 25% v/w PEG 4000
Unit Cell:
a: 66.840 Å b: 70.227 Å c: 71.212 Å α: 90.000° β: 107.680° γ: 90.000°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 2.29 Solvent Content: 46.21
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.5000 47.1750 95351 1710 94.9500 0.1615 0.1884 33.2646
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.300 48.795 72.500 0.029 ? 17.390 2.810 ? 110991 ? ? 24.866
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.300 1.380 12.300 ? ? 0.610 1.449 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ESRF BEAMLINE ID29 0.965 ESRF ID29
Software
Software Name Purpose Version
PHENIX refinement 1.16_3549
XDS data reduction 3.20
XDS data scaling 3.20
PHENIX phasing 1.16-3549
PDB_EXTRACT data extraction 3.24
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