6SEO

X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.5 293 50 mM ammonium sulfate 50 mM Bis-TRIS pH 6.5 30% Pentaerythritol ethoxylate (15/4 EO/OH)
Unit Cell:
a: 135.850 Å b: 135.850 Å c: 88.720 Å α: 90.000° β: 90.000° γ: 120.000°
Symmetry:
Space Group: H 3 2
Crystal Properties:
Matthew's Coefficient: 3.02 Solvent Content: 59.26
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.5500 27.9200 7693 379 74.1000 0.1860 0.2320 76.1600
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.521 41.507 72.500 0.112 0.112 15.500 10.100 ? 7784 ? ? 86.300
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.521 2.643 28.000 ? 2.249 1.100 10.200 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X10SA 1.000000 SLS X10SA
Software
Software Name Purpose Version
BUSTER refinement 2.11.7
PDB_EXTRACT data extraction 3.25
XDS data reduction .
STARANISO data scaling .
PHASER phasing .