X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 4.59 293 200 mM Ammonium sulfate 100 mM Sodium acetate trihydrate pH 4.59 35% Pentaerythritol ethoxylate (15/4 EO/OH)
Unit Cell:
a: 66.490 Å b: 132.070 Å c: 62.020 Å α: 90.000° β: 115.870° γ: 90.000°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 2.30 Solvent Content: 46.43
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.6500 23.7500 47141 2362 81.8000 0.1910 0.2190 36.7700
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.614 50.224 77.000 0.038 0.038 14.300 3.400 ? 47462 ? ? 31.430
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.614 1.732 20.100 ? 0.835 1.400 3.500 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X10SA 0.999820 SLS X10SA
Software
Software Name Purpose Version
XDS data reduction .
STARANISO data scaling .
PHASER phasing .
BUSTER refinement 2.11.7
PDB_EXTRACT data extraction 3.25
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