6SDK

X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 277 5-16 % PEG 8000, 0.15-0.25 M calcium acetate or calcium chloride, and 50 mM Tris pH 7.5 or 8
Unit Cell:
a: 47.186 Å b: 104.501 Å c: 103.193 Å α: 90.000° β: 102.568° γ: 90.000°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 2.72 Solvent Content: 54.82
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD FREE R-VALUE 1.81 46.38 174420 8730 99.57 0.1852 0.2128 40.17
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.8 46.4 99.8 ? 0.091 11.1 6.6 ? 174420 ? ? 30.47
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.8 1.8 ? ? 1.8 0.8 ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X10SA 0.9792 SLS X10SA
Software
Software Name Purpose Version
PHENIX refinement 1.13_2998
XDS data reduction BUILT=20180126
XDS data scaling BUILT=20180126
CRANK2 phasing .