X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.5 293 10% PEG 10000 8% Ethylene glycol 0.1 M HEPES
Unit Cell:
a: 144.597 Å b: 144.597 Å c: 144.597 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: I 2 3
Crystal Properties:
Matthew's Coefficient: 3.470 Solvent Content: 64.540
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 3.2500 102.2500 7388 449 96.8100 0.1862 0.2318 83.2500
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.250 102.250 96.800 0.07600 ? 17.290 4.400 ? 7837 ? ? 66.188
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.250 102.250 97.700 ? ? 58.780 4.200 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100.000 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X06SA 1.00004291534 SLS X06SA
Software
Software Name Purpose Version
XDS data reduction .
XSCALE data scaling .
REFMAC refinement 5.8.0049
PDB_EXTRACT data extraction 3.25
MOLREP phasing .