X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.5 298 NaCl 2.8-3.3 M, 0.1 M HEPES pH 7.5
Unit Cell:
a: 62.191 Å b: 62.191 Å c: 400.999 Å α: 90.000° β: 90.000° γ: 120.000°
Symmetry:
Space Group: P 61 2 2
Crystal Properties:
Matthew's Coefficient: 2.98 Solvent Content: 58.77
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 2.3000 53.8590 38529 1844 99.9900 0.2490 0.2849 65.0196
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.14 57.29 99.9 0.119 ? 22 40.8 ? 26972 ? ? 38.445
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.14 2.20 99.3 ? ? 2.6 22.4 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X06DA 0.97941 SLS X06DA
Software
Software Name Purpose Version
xia2 data reduction 0.5.546-gdf2e053-dials-1.9
DIALS data reduction 1.9.3-gb491019a-release
pointless data scaling 1.11.12
Aimless data scaling 0.7.1
BUCCANEER model building 1.5
Coot model building 0.8.9.2
TRUNCATE data reduction 1.17.29
AutoSol phasing 1.14_3260
PHENIX refinement 1.14_3260
PDB_EXTRACT data extraction 3.25