X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 293.15 500mM MOPS+500mM HEPES pH 7.5 (Morpheus kit buffer system 2), 100mM carboxylic acids, 5% PEG 8000, 20% ethylene glycol
Unit Cell:
a: 92.967 Å b: 97.874 Å c: 144.561 Å α: 90.420° β: 97.100° γ: 110.270°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 3.08 Solvent Content: 60.03
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 3.73 48.80 46426 9250 93.2300 0.2512 0.3004 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.73 48.80 94.0 0.095 ? 7.4 3.5 ? 46426 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.73 3.86 51.2 ? ? 1.1 3.0 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SOLEIL BEAMLINE PROXIMA 1 0.978570 SOLEIL PROXIMA 1
Software
Software Name Purpose Version
PHENIX refinement 1.8.2_1309
XDS data reduction .
XDS data scaling .
PHASER phasing .