6S5S

X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.5 291 0.1 M BIS-TRIS pH 6.5, 3.0 M Sodium chloride
Unit Cell:
a: 106.297 Å b: 106.297 Å c: 57.090 Å α: 90.000° β: 90.000° γ: 120.000°
Symmetry:
Space Group: P 6 2 2
Crystal Properties:
Matthew's Coefficient: 3.32 Solvent Content: 62.99
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.4330 48.5170 66035 3292 99.5000 0.1636 0.1785 20.9158
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.433 48.517 99.5 ? ? 14.80 17.1 ? 66042 ? ? 20.3
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.433 1.440 99.7 ? ? 0.73 5.5 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 80 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X06DA 1.000033 SLS X06DA
Software
Software Name Purpose Version
XDS data reduction .
XSCALE data scaling .
PHASER phasing 2.8.1
PHENIX refinement 1.11.1_2575
PDB_EXTRACT data extraction 3.25