X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7 291 0.1M Bis-Tris, 0.03 M HCl, 23% PEG3350
Unit Cell:
a: 90.190 Å b: 79.050 Å c: 39.870 Å α: 90.000° β: 110.770° γ: 90.000°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 2.26 Solvent Content: 45.62
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.5990 42.1650 34158 1083 98.8100 0.1799 0.2046 26.3026
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.600 42.165 98.900 0.101 ? 17.560 6.490 ? 34254 ? ? 14.620
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.600 1.640 99.000 ? ? 3.020 6.947 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X10SA 0.97792876162 SLS X10SA
Software
Software Name Purpose Version
PHENIX refinement 1.9_1692
XDS data reduction VERSION JAN 31, 2018
XSCALE data scaling VERSION JAN 31, 2018
PHASER phasing 2.5.6
PDB_EXTRACT data extraction 3.25