X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.3 277 0.2 M Ammonium nitrate pH 6.3, 20% PEG 3350
Unit Cell:
a: 60.950 Å b: 93.920 Å c: 75.570 Å α: 90.000° β: 93.030° γ: 90.000°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 2.87 Solvent Content: 57.17
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 1.51000183032 33.7871482655 132704 6726 99.8082115539 0.181402239935 0.203826681086 30.1701442648
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.51 33.79 99.9 0.0748 ? 12.03 6.5 ? 132783 ? ? 21.2079757645
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.51 1.54 100 ? ? 1.1 6.7 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON DIAMOND BEAMLINE I04 0.97952 Diamond I04
Software
Software Name Purpose Version
PHENIX refinement 1.11.1_2575
PHENIX refinement 1.11.1_2575
XDS data reduction .
XDS data scaling .
SHELXD phasing .