ELECTRON MICROSCOPY

Sample

C1-S20DeltaLoop State 1 of yeast pre-40S particles purified with Tsr1-TAP as bait, in mutant conditions (deletion of aa 68-78 of Rps20)

Specimen Preperation
Sample Aggregation State PARTICLE
Vitrification Instrument LEICA EM GP
Cryogen Name ETHANE
Sample Vitrification Details blot 1.7-1.9 seconds before plunging
3D Reconstruction
Reconstruction Method SINGLE PARTICLE
Number of Particles 54130
Reported Resolution (Å) 3.47
Resolution Method FSC 0.143 CUT-OFF
Other Details ?
Refinement Type
Symmetry Type POINT
Map-Model Fitting and Refinement
ID 1
Refinement Space ?
Refinement Protocol ?
Refinement Target ?
Overall B Value ?
Fitting Procedure ?
Details ?
Data Acquisition
Detector Type GATAN K2 SUMMIT (4k x 4k)
Electron Dose (electrons/Å2) 32.4
Imaging Experiment
Date of Experiment ?
Temprature (Kelvin)
Microscope Model FEI TITAN KRIOS
Minimum Defocus (nm) 800
Maximum Defocus (nm) 3000
Minimum Tilt Angle (degrees) ?
Maximum Tilt Angle (degrees) ?
Nominal CS 2.7
Imaging Mode BRIGHT FIELD
Specimen Holder Model FEI TITAN KRIOS AUTOGRID HOLDER
Nominal Magnification ?
Calibrated Magnification ?
Source FIELD EMISSION GUN
Acceleration Voltage (kV) 300
Imaging Details ?
Imaging Experiment
Task Software Package Version
IMAGE ACQUISITION EPU ?
CTF CORRECTION RELION ?
MODEL FITTING UCSF Chimera ?
MODEL FITTING Coot ?
INITIAL EULER ASSIGNMENT RELION ?
FINAL EULER ASSIGNMENT RELION 2.1
CLASSIFICATION RELION ?
RECONSTRUCTION RELION 2.1
MODEL REFINEMENT REFMAC 5
MODEL REFINEMENT PHENIX ?
Image Processing
CTF Correction Type CTF Correction Details Number of Particles Selected Particle Selection Details
PHASE FLIPPING AND AMPLITUDE CORRECTION ?
Feedback Form
Name
Email
Institute
Feedback