X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.5 291 50mM BIS TRIS pH6.5 + 30% pentaerythritol ethoxylate + 50mM ammonium sulfate
Unit Cell:
a: 71.079 Å b: 73.701 Å c: 81.534 Å α: 65.58° β: 73.91° γ: 69.70°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.26 Solvent Content: 45.50
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.80 19.93 111063 865 86.50 0.16826 0.20680 17.327
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.80 45.57 96.2 ? ? 6.1 2.4 ? 124434 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.80 1.83 ? ? ? ? ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ALBA BEAMLINE XALOC 0.979270 ALBA XALOC
Software
Software Name Purpose Version
REFMAC refinement 5.8.0238
XDS data reduction .
Aimless data scaling .
PHASER phasing .