6Q9S

X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.5 298 2.25M AmSO4, 6% w/v 18-crown-ether, 0.1M HEPES
Unit Cell:
a: 93.581 Å b: 93.581 Å c: 198.467 Å α: 90.000° β: 90.000° γ: 120.000°
Symmetry:
Space Group: P 64 2 2
Crystal Properties:
Matthew's Coefficient: 3.70 Solvent Content: 66.76
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.4000 19.9500 19806 1043 99.8600 0.2500 0.2682 51.7950
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.400 19.950 99.600 0.062 ? 27.100 12.700 ? 20849 ? ? 54.200
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.400 2.46 98.100 ? ? 4.800 12.900 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X10SA 0.9999 SLS X10SA
Software
Software Name Purpose Version
XDS data reduction .
XSCALE data scaling .
PHASER phasing .
REFMAC refinement .
PDB_EXTRACT data extraction 3.24