X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.5 291 1.5 M Ammonium sulfate, 0.1 M Tris pH 8.5, 12% v/v Glycerol
Unit Cell:
a: 56.977 Å b: 56.977 Å c: 173.543 Å α: 90.000° β: 90.000° γ: 120.000°
Symmetry:
Space Group: P 62 2 2
Crystal Properties:
Matthew's Coefficient: 3.12 Solvent Content: 60.61
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.4380 47.4620 31115 2808 99.1700 0.1713 0.1967 28.7060
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.438 47.462 99.200 ? 0.058 17.400 9.200 31196 31196 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.440 1.520 94.900 ? 1.335 0.600 8.700 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 80 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X06DA 1.036790 SLS X06DA
Software
Software Name Purpose Version
XDS data reduction .
SCALA data scaling 3.3.22
PHASER phasing .
PHENIX refinement .
PDB_EXTRACT data extraction 3.24