X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 291 12,5% w/v PEG 4000, 20% v/v 1,2,6-hexanetriol, 30mM lithium sulfate, 30mM sodium sulfate, 30mM pottasium sulfate, 100mM GlyGly/AMPD pH 8,5
Unit Cell:
a: 54.846 Å b: 55.767 Å c: 61.163 Å α: 96.18° β: 105.54° γ: 112.82°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 3.11 Solvent Content: 60.47
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 2.747 30.156 14368 721 88.19 0.2305 0.2708 71.80
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.747 30.16 88.55 0.08092 ? 8.37 2.1 ? 14434 ? ? 56.41
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.747 2.846 80.62 ? ? 1.38 2.1 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON BESSY BEAMLINE 14.1 0.9184 BESSY 14.1
Software
Software Name Purpose Version
PHENIX refinement 1.9_1692
XDS data reduction Jan 26, 2018
XDS data scaling Jan 26, 2018
PHASER phasing 2.5.6
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