X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 9.2 293.15 50% Ethylene glycol, 0.1M Tris-HCl, 0.2 M MgCl2, pH 8.5
Unit Cell:
a: 18.777 Å b: 38.656 Å c: 45.329 Å α: 69.039° β: 79.584° γ: 77.438°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.24 Solvent Content: 45.13
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.03 42.06 51603 2595 90.34 0.1452 0.1771 20.06
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.03 42.06 92.2 0.058 ? 8.4 3.3 ? 52665 ? ? 11.27
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.03 1.05 60.5 ? ? 0.6 2.9 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON DIAMOND BEAMLINE I24 0.8000 Diamond I24
Software
Software Name Purpose Version
PHENIX refinement 1.13_2998
REFMAC refinement 5.8.0158, CCP4
Aimless data scaling 0.5.32, CCP4
XDS data reduction 20161205
PHASER phasing 2.7.17, CCP4