X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.8 293.15 19% PEG monomethyl ether 2K, 0.1M Tris-HCl, pH 8.6
Unit Cell:
a: 19.736 Å b: 28.076 Å c: 48.384 Å α: 86.361° β: 86.681° γ: 77.210°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 1.96 Solvent Content: 37.38
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.03 27.34 47069 2247 94.18 0.1447 0.1738 20.76
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.03 27.341973967 94.5 0.041 ? 7.2 1.9 ? 47206 ? ? 11.81
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.03 1.05 92.5 ? ? 1.5 1.7 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON DIAMOND BEAMLINE I03 0.7000 Diamond I03
Software
Software Name Purpose Version
PHENIX refinement 1.13_2998
REFMAC refinement 5.8.0158, CCP4
Aimless data scaling 0.5.32, CCP4
PHASER phasing 2.7.17, CCP4
XDS data reduction 20161205