X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 293 0.1 M bicine, pH 9.0, and 1.6 M ammonium sulfate
Unit Cell:
a: 46.230 Å b: 62.530 Å c: 108.359 Å α: 82.720° β: 82.480° γ: 68.340°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.45 Solvent Content: 49.84
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.5750 52.8450 31186 3247 72.9900 0.2365 0.2921 44.6176
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.57 52.85 88.4 ? 0.16 1.9 1.8 ? 31186 ? ? 42.12
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.57 2.71 94.7 ? 1.0 0.6 1.8 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 23-ID-B 1.0 APS 23-ID-B
Software
Software Name Purpose Version
PHENIX refinement 1.16_3549
XDS data reduction .
XDS data scaling .
PHASER phasing .
JBluIce-EPICS data collection .
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