ELECTRON MICROSCOPY

Sample

ClpX-ClpP-substrate-ATPrS

Specimen Preperation
Sample Aggregation State PARTICLE
Vitrification Instrument GATAN CRYOPLUNGE 3
Cryogen Name ETHANE
Sample Vitrification Details ?
3D Reconstruction
Reconstruction Method SINGLE PARTICLE
Number of Particles 26592
Reported Resolution (Å) 4.28
Resolution Method FSC 0.143 CUT-OFF
Other Details ?
Refinement Type
Symmetry Type POINT
Map-Model Fitting and Refinement
ID 1
Refinement Space ?
Refinement Protocol ?
Refinement Target ?
Overall B Value ?
Fitting Procedure ?
Details ?
Data Acquisition
Detector Type GATAN K2 SUMMIT (4k x 4k)
Electron Dose (electrons/Å2) 56
Imaging Experiment
Date of Experiment ?
Temprature (Kelvin)
Microscope Model FEI TECNAI ARCTICA
Minimum Defocus (nm) -800
Maximum Defocus (nm) ?
Minimum Tilt Angle (degrees) ?
Maximum Tilt Angle (degrees) ?
Nominal CS ?
Imaging Mode BRIGHT FIELD
Specimen Holder Model FEI TITAN KRIOS AUTOGRID HOLDER
Nominal Magnification 36000
Calibrated Magnification ?
Source FIELD EMISSION GUN
Acceleration Voltage (kV) 200
Imaging Details ?
Imaging Experiment
Task Software Package Version
IMAGE ACQUISITION SerialEM ?
CTF CORRECTION CTFFIND 4.1.12
MODEL FITTING UCSF Chimera ?
MODEL REFINEMENT PHENIX ?
INITIAL EULER ASSIGNMENT RELION 2
FINAL EULER ASSIGNMENT RELION 2
CLASSIFICATION RELION 2
RECONSTRUCTION RELION 2
Image Processing
CTF Correction Type CTF Correction Details Number of Particles Selected Particle Selection Details
PHASE FLIPPING AND AMPLITUDE CORRECTION ?