X-RAY DIFFRACTION
| Crystal ID | Scattering Type | Data Collection Temprature | Detector | Detector Type | Details | Collection Date | Monochromator | Protocol |
|---|---|---|---|---|---|---|---|---|
| 1 | 290 K | ? |
| Source | Type | Wavelength List | Synchrotron Site | Beamline |
|---|---|---|---|---|
| SEALED TUBE | OTHER | 1.542 | ? | ? |
| Software Name | Purpose | Version |
|---|---|---|
| PROLSQ | refinement | . |
| REFPK | data processing | . |
| SORTAV | data scaling | . |
| SORTVA | data reduction | . |
| TFORM | phasing | . |
| FRFS | phasing | . |
