X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 295 0.15-0.2 M ammonium sulfate, 0.1M Tris pH 5-8.5
Unit Cell:
a: 231.660 Å b: 231.660 Å c: 231.660 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: I 21 3
Crystal Properties:
Matthew's Coefficient: 5.37 Solvent Content: 77.11
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 4.0000 38.6100 17579 850 99.8100 0.2065 0.2539 209.0791
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.790 49.370 99.800 0.201 ? 11.000 19.800 ? 20596 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.790 4.150 99.500 ? ? ? 19.100 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 80 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRL BEAMLINE BL12-2 0.9796 SSRL BL12-2
Software
Software Name Purpose Version
Aimless data scaling 0.7.4
PHENIX refinement 1.15.2_3472
PDB_EXTRACT data extraction 3.25
XDS data reduction .
PHASER phasing .