X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.5 293 100 mM Tris 8.5, 10% PEG 8000, 200 mM ammonium sulfate
Unit Cell:
a: 118.153 Å b: 126.595 Å c: 148.165 Å α: 87.240° β: 79.150° γ: 86.290°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 3.37 Solvent Content: 63.51
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 3.4 49.860 114485 ? 98.9 ? 0.2746 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.400 49.860 99.000 0.127 ? 3.900 2.000 ? 114498 ? ? 78.540
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.400 4.160 98.800 ? ? ? 2.000 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON CLSI BEAMLINE 08ID-1 0.979490 CLSI 08ID-1
Software
Software Name Purpose Version
PHENIX refinement 1.12_2829
XDS data reduction .
Aimless data scaling 0.3.6
PHASER phasing 2.5.6
PDB_EXTRACT data extraction 3.25