ELECTRON MICROSCOPY

Sample

Complex of B41 SOSIP.664 trimer with three SF12 Fabs and one 10-1074 Fab

Specimen Preperation
Sample Aggregation State PARTICLE
Vitrification Instrument FEI VITROBOT MARK IV
Cryogen Name ETHANE
Sample Vitrification Details 0 blot force, 3 second blot time, 3 uL sample added to freshly glow-discharged grids
3D Reconstruction
Reconstruction Method SINGLE PARTICLE
Number of Particles 301920
Reported Resolution (Å) 3.28
Resolution Method FSC 0.143 CUT-OFF
Other Details ?
Refinement Type
Symmetry Type POINT
Map-Model Fitting and Refinement
ID 1
Refinement Space REAL
Refinement Protocol RIGID BODY FIT
Refinement Target Correlation coefficient
Overall B Value ?
Fitting Procedure ?
Details ?
Data Acquisition
Detector Type GATAN K2 SUMMIT (4k x 4k)
Electron Dose (electrons/Å2) 40
Imaging Experiment
Date of Experiment ?
Temprature (Kelvin)
Microscope Model FEI TITAN KRIOS
Minimum Defocus (nm) 1200
Maximum Defocus (nm) 3000
Minimum Tilt Angle (degrees) ?
Maximum Tilt Angle (degrees) ?
Nominal CS 2.7
Imaging Mode BRIGHT FIELD
Specimen Holder Model FEI TITAN KRIOS AUTOGRID HOLDER
Nominal Magnification 130000
Calibrated Magnification ?
Source FIELD EMISSION GUN
Acceleration Voltage (kV) 300
Imaging Details ?
Imaging Experiment
Task Software Package Version
IMAGE ACQUISITION EPU ?
CTF CORRECTION Gctf 1.06
MODEL FITTING UCSF Chimera ?
INITIAL EULER ASSIGNMENT cryoSPARC 2.1
FINAL EULER ASSIGNMENT RELION 3.0
CLASSIFICATION RELION 3.0
RECONSTRUCTION RELION 3.0
MODEL REFINEMENT PHENIX 1.14
Image Processing
CTF Correction Type CTF Correction Details Number of Particles Selected Particle Selection Details
PHASE FLIPPING AND AMPLITUDE CORRECTION ?