X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.0 293.15 2.0M Ammonium sulfate, 0.05M BisTris pH 5.0
Unit Cell:
a: 114.730 Å b: 114.730 Å c: 46.601 Å α: 90.00° β: 90.00° γ: 120.00°
Symmetry:
Space Group: P 3 2 1
Crystal Properties:
Matthew's Coefficient: 3.2 Solvent Content: 61.53
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD FREE R-VALUE 1.940 29.241 26292 1561 99.68 0.2079 0.2299 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.79 99.37 99.7 0.047 ? 25.6 9.4 ? 26388 ? ? 40.76
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.79 1.83 97.2 ? ? 1.0 9.3 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 113.15 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 23-ID-D 1.03321 APS 23-ID-D
Software
Software Name Purpose Version
PHENIX refinement (1.13_2998: ???)
XDS data reduction .
Aimless data scaling .
PHASER phasing .