ELECTRON MICROSCOPY

Sample

3.5 angstroms Dot1L-H2BK120Ub Sample 1A

Specimen Preperation
Sample Aggregation State PARTICLE
Vitrification Instrument FEI VITROBOT MARK IV
Cryogen Name PROPANE
Sample Vitrification Details blotted for 3s before plunging
3D Reconstruction
Reconstruction Method SINGLE PARTICLE
Number of Particles 211279
Reported Resolution (Å) 3.5
Resolution Method FSC 0.143 CUT-OFF
Other Details ?
Refinement Type
Symmetry Type POINT
Map-Model Fitting and Refinement
ID 1
Refinement Space REAL
Refinement Protocol OTHER
Refinement Target ?
Overall B Value 91.61
Fitting Procedure ?
Details ?
Data Acquisition
Detector Type GATAN K2 SUMMIT (4k x 4k)
Electron Dose (electrons/Å2) 1.1
Imaging Experiment
Date of Experiment ?
Temprature (Kelvin)
Microscope Model FEI TITAN KRIOS
Minimum Defocus (nm) 1700
Maximum Defocus (nm) 3200
Minimum Tilt Angle (degrees) ?
Maximum Tilt Angle (degrees) ?
Nominal CS 2.7
Imaging Mode BRIGHT FIELD
Specimen Holder Model ?
Nominal Magnification 130000
Calibrated Magnification ?
Source FIELD EMISSION GUN
Acceleration Voltage (kV) 300
Imaging Details ?
Imaging Experiment
Task Software Package Version
IMAGE ACQUISITION Scipion ?
CTF CORRECTION Gctf v1
MODEL FITTING UCSF Chimera 1.13.1
CLASSIFICATION RELION ?
RECONSTRUCTION cisTEM ?
MODEL REFINEMENT PHENIX 1.14
Image Processing
CTF Correction Type CTF Correction Details Number of Particles Selected Particle Selection Details
PHASE FLIPPING AND AMPLITUDE CORRECTION ?