X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.2 293 21% w/v PEG550 MME, 50 mM magnesium acetate, 100 mM Tris, pH 8.2
Unit Cell:
a: 125.569 Å b: 125.569 Å c: 82.787 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: I 4
Crystal Properties:
Matthew's Coefficient: 2.70 Solvent Content: 54.37
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD FREE R-VALUE 1.85 39.71 55036 1998 99.68 0.1747 0.2096 49.12
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.85 50.00 99.7 0.063 0.063 23.4 7.4 ? 55045 ? ? 39.01
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.85 1.88 ? ? 1.670 1.0 7.2 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ALS BEAMLINE 8.2.2 0.99996 ALS 8.2.2
Software
Software Name Purpose Version
PHENIX refinement 1.13_2998
HKL-2000 data collection HKL2000_v712-Linux
HKL-2000 data reduction HKL2000_v712-Linux
HKL-2000 data scaling HKL2000_v712-Linux
PHASER phasing .
Feedback Form
Name
Email
Institute
Feedback