X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.2 293.15 54 uM protein, 5% w/v PEG8000, 500 mM sodium chloride, 75 mM imidazole, 10 mM Tris, 50 mM potassium phosphate, 10 mM trimethylamine-HCl
Unit Cell:
a: 79.468 Å b: 79.468 Å c: 262.804 Å α: 90.00° β: 90.00° γ: 120.00°
Symmetry:
Space Group: P 64 2 2
Crystal Properties:
Matthew's Coefficient: 3.48 Solvent Content: 64.7
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 3.300 66.576 8049 639 99.95 0.2489 0.2986 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.3 68.82 100 ? ? 10.7 32.9 ? 8106 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.30 3.56 100 ? ? 2.3 35.4 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 17-ID 0.97625 APS 17-ID
Software
Software Name Purpose Version
PHENIX refinement (1.13_2998: ???)
iMOSFLM data reduction 7.2.2
PHASER phasing (1.13_2998: ???)
PHENIX refinement (1.13_2998: ???)
Aimless data scaling 0.7.1
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