X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 293.15 0.1 M MES pH 6.0, 0.1 M ammonium phosphate dibasic, 1.5% 1,2,3-Heptanetriol, 22% PEG 300
Unit Cell:
a: 39.010 Å b: 121.090 Å c: 157.010 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: P 2 2 21
Crystal Properties:
Matthew's Coefficient: 2.73 Solvent Content: 54.88
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 2.80 47.94 18441 926 96.24 0.2480 0.2944 74.4
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.8 50.0 96.2 0.27 ? 5.48 6.63 ? 18464 ? ? 81.36
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.8 2.9 94 ? ? 0.92 3.5 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 293.15 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 23-ID-B 1.033 APS 23-ID-B
Software
Software Name Purpose Version
BUSTER refinement .
PHENIX refinement 1.12_2829
XDS data reduction .
XSCALE data scaling .
PHASER phasing .
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