X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.5 277.15 10% w/v PEG 8000, 20% v/v ethylene glycol, 0.03 M of each halide (sodium fluoride, sodium bromide, sodium iodide), 0.1 M bicine/Trizma base pH 8.5
Unit Cell:
a: 89.592 Å b: 51.650 Å c: 85.527 Å α: 90.00° β: 110.48° γ: 90.00°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 3.02 Solvent Content: 59.29
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.30 44.04 14808 1486 90.1 0.261 0.279 93.19
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.230 70.000 98.4 ? ? 16.1000 3.600 ? 16424 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.30 2.34 86.9 ? ? 0.800 ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ALS BEAMLINE 8.2.1 0.999933 ALS 8.2.1
Software
Software Name Purpose Version
PHENIX refinement DEV_2611
PDB_EXTRACT data extraction 3.24
HKL-2000 data reduction .
HKL-2000 data scaling .
PHENIX phasing .