ISDA

X-RAY DIFFRACTION

Crystallization Details

Method	pH	Temprature	Details
X-RAY DIFFRACTION	6.2	293	PEG 8000, Na/K phosphate, NaCl

Unit Cell:

a: 132.360 Å b: 132.360 Å c: 67.360 Å α: 90.000° β: 90.000° γ: 120.000°

Symmetry:

Space Group: P 6 2 2

Crystal Properties:

Matthew's Coefficient: 2.63 Solvent Content: 53.23

Refinement Statistics

Diffraction ID	Structure Solution Method	Cross Validation Method	Resolution Limit (High)	Resolution Limit (Low)	Number of Reflections (Observed)	Number of Reflections (R-free)	Percent Reflections (Observed)	R-Work	R-Free	Mean Isotropic
X-RAY DIFFRACTION	AB INITIO PHASING	THROUGHOUT	1.9000	58.0800	27881	1494	99.4000	0.1950	0.2190	40.7600

Data Collection

Overall

Resolution Limit (High)	Resolution Limit (Low)	Percent Possible (Observed)	R Merge I (Observed)	R Sym I (Observed)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
1.900	67.360	99.700	0.152	?	23.900	6.500	?	27914	?	?	31.670

Highest Resolution Shell

#	Resolution Limits (Low)	Resolution Limits (High)	Percent Possible (All)	Percent Possible (Observed)	R-Sym I (Observed)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1	1.900	1.940	99.300	?	?	?	6.800	?

Diffraction

Diffraction experiment

Crystal ID	Scattering Type	Data Collection Temprature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1		100 K			?

Radiation Source

Source	Type	Wavelength List	Synchrotron Site	Beamline
SYNCHROTRON	SOLEIL BEAMLINE PROXIMA 2	0.97910	SOLEIL	PROXIMA 2

Software