X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 293 0.1 M Tris-HCl at pH 7.4, 0.1 M MgCl2, 16.5% PEG 3350
Unit Cell:
a: 71.610 Å b: 79.430 Å c: 85.930 Å α: 89.96° β: 92.53° γ: 94.76°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.1 Solvent Content: 41.34
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 2.90 37.51 36574 1827 87.5 0.220 0.283 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.900 37.514 87.5 ? ? 11.6000 3.400 ? 36613 ? ? 53.40
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.90 2.98 86.0 ? ? 1.600 1.80 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRL BEAMLINE BL14-1 1.195 SSRL BL14-1
Software
Software Name Purpose Version
PHENIX refinement (1.13RC2_2986: ???)
XDS data reduction .
XDS data scaling .
PHENIX phasing .