X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.5 277 31% PEG 3350, 50 mM Potassium Bromide, Tris pH7.5
Unit Cell:
a: 65.142 Å b: 73.661 Å c: 92.842 Å α: 90.030° β: 90.030° γ: 90.000°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.13 Solvent Content: 42.26
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.1990 19.6650 84064 1237 95.8900 0.1744 0.2157 38.2916
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.199 50.000 96.000 0.081 ? 12.500 2.500 ? 84136 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.200 2.240 93.800 ? ? ? 2.500 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU FR-E 1.54 ? ?
Software
Software Name Purpose Version
PHENIX refinement 1.14_3260
DENZO data reduction .
HKL-2000 data scaling .
PHASER phasing 2.8.2
PDB_EXTRACT data extraction 3.24
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