X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.5 293 0.2 M KCl, 0.05 M HEPES pH 7.5, 35% v/v pentaerythritol propoxylate, 5/4 PO/OH
Unit Cell:
a: 11.160 Å b: 28.360 Å c: 29.410 Å α: 111.79° β: 94.27° γ: 95.12°
Symmetry:
Space Group: P -1
Crystal Properties:
Matthew's Coefficient: 1.64 Solvent Content: 24.93
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 1.450 16.016 5248 518 89.22 0.1832 0.2159 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.45 16.02 89.3 0.063 ? 5.0 1.8 ? 5252 ? ? 48.6
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.451 1.502 56.70 ? ? 1.09 1.7 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 23-ID-B 0.68880 APS 23-ID-B
Software
Software Name Purpose Version
PHENIX refinement (1.13_2998)
XDS data reduction .
XSCALE data scaling .
PHASER phasing .
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