ISDA: 6NB2

X-RAY DIFFRACTION

Crystallization Details

Method	pH	Temprature	Details
X-RAY DIFFRACTION	7.5	289	MORPHEUS D6 (50 MM HEPES, 50 MM MOPS, PH 7.5, 20 MM 1,6 HEXANEDIOL, 20 MM 1-BUTANOL, 20 MM 1,2 PROPANEDIOL, 20 MM 2-PROPANOL, 20 MM 1,4-BUTANEDIOL; 20 MM 1,3- PROPANEDIOL, 20% GLYCEROL, 10% PEG 4000), TRAY 297441D6 PUCK VKP7- 5, VAPOR DIFFUSION, SITTING DROP, TEMPERATURE 289K

Unit Cell:

a: 116.450 Å b: 116.450 Å c: 142.780 Å α: 90.00° β: 90.00° γ: 90.00°

Symmetry:

Space Group: P 42 21 2

Crystal Properties:

Matthew's Coefficient: 2.56 Solvent Content: 51.92

Refinement Statistics

Diffraction ID	Structure Solution Method	Cross Validation Method	Resolution Limit (High)	Resolution Limit (Low)	Number of Reflections (Observed)	Number of Reflections (R-free)	Percent Reflections (Observed)	R-Work	R-Free	Mean Isotropic
X-RAY DIFFRACTION	MOLECULAR REPLACEMENT	FREE R-VALUE	1.85	45.12	84018	1969	100.0	0.147	0.172	31.48

Data Collection

Overall

Resolution Limit (High)	Resolution Limit (Low)	Percent Possible (Observed)	R Merge I (Observed)	R Sym I (Observed)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
1.850	50	100.0	0.05900	?	24.2400	10.27	?	84112	?	-3.000	31.64

Highest Resolution Shell

#	Resolution Limits (Low)	Resolution Limits (High)	Percent Possible (All)	Percent Possible (Observed)	R-Sym I (Observed)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1	1.85	1.90	100.0	?	?	4.920	?	?

Diffraction

Diffraction experiment

Crystal ID	Scattering Type	Data Collection Temprature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1		100 K			?

Radiation Source

Source	Type	Wavelength List	Synchrotron Site	Beamline
SYNCHROTRON	APS BEAMLINE 21-ID-F	0.97872	APS	21-ID-F

Software