X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.5 293.15 31-34% PEG400, 100 mM HEPES, pH 7.5, 1% 1,2,3-heptanetriol
Unit Cell:
a: 178.682 Å b: 52.589 Å c: 125.917 Å α: 90.0° β: 123.859° γ: 90.0°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 3.80 Solvent Content: 67.64
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 2.95934213525 28.5196106168 18742 1135 90.7558955983 0.207099158562 0.24486451981 53.7137652891
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.95 30 92.6 0.167 ? 1.52 3.3 ? 18742 ? ? 52.7347764892
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.95 3.09 75 ? ? 1.52 ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 77 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 23-ID-D 0.987 APS 23-ID-D
Software
Software Name Purpose Version
HKL-2000 data collection 1.9_1692
PHENIX refinement 1.9_1692
PHASER phasing .
Coot model building .
SCALEPACK data scaling .
HKL-2000 data reduction .
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