X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.8 298 12% PEG 4000, 100mM NaCacodylate, 100 mM NaCitrate
Unit Cell:
a: 250.057 Å b: 69.030 Å c: 64.687 Å α: 90.000° β: 91.510° γ: 90.000°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 2.93 Solvent Content: 58.05
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.9000 29.6690 24687 1984 99.8500 0.2199 0.2702 43.2151
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.900 29.670 99.800 0.154 ? 6.800 4.500 ? 24697 ? ? 56.490
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.900 3.080 99.900 ? ? ? 4.700 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS-II BEAMLINE 17-ID-2 0.97936 NSLS-II 17-ID-2
Software
Software Name Purpose Version
XDS data reduction .
Aimless data scaling 0.7.2
PHASER phasing .
PHENIX refinement 1.10.1_2155
PDB_EXTRACT data extraction 3.24