ISDA

X-RAY DIFFRACTION

Crystallization Details

Method	pH	Temprature	Details
X-RAY DIFFRACTION	7.5	287	InvbJ.18715.a.KN11/HosaA.20194.a.TC11 batch PD39296/PD38299 at a combined complex 10 mg/mL against PACT screen condition G9: 0.2 M potassium/sodium tartrate, 0.1 M BisTris Propane pH 7.5, 20% PEG 3350 supplemented with 20% ethylene glycol as cryo-protectant, crystal tracking ID 300847g9, unique puck ID sto6-4

Unit Cell:

a: 118.460 Å b: 118.460 Å c: 162.440 Å α: 90.000° β: 90.000° γ: 120.000°

Symmetry:

Space Group: P 3 2 1

Crystal Properties:

Matthew's Coefficient: 3.10 Solvent Content: 60.34

Refinement Statistics

Diffraction ID	Structure Solution Method	Cross Validation Method	Resolution Limit (High)	Resolution Limit (Low)	Number of Reflections (Observed)	Number of Reflections (R-free)	Percent Reflections (Observed)	R-Work	R-Free	Mean Isotropic
X-RAY DIFFRACTION	MOLECULAR REPLACEMENT	THROUGHOUT	2.9200	47.8860	29208	1534	99.9300	0.2045	0.2642	87.0651

Data Collection

Overall

Resolution Limit (High)	Resolution Limit (Low)	Percent Possible (Observed)	R Merge I (Observed)	R Sym I (Observed)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
2.920	47.886	99.900	0.107	?	15.230	7.324	?	29212	?	?	66.752

Highest Resolution Shell

#	Resolution Limits (Low)	Resolution Limits (High)	Percent Possible (All)	Percent Possible (Observed)	R-Sym I (Observed)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1	2.920	3.000	100.000	?	?	2.000	7.556	?

Diffraction

Diffraction experiment

Crystal ID	Scattering Type	Data Collection Temprature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1		100 K			?

Radiation Source

Source	Type	Wavelength List	Synchrotron Site	Beamline
SYNCHROTRON	APS BEAMLINE 21-ID-F	0.97872	APS	21-ID-F

Software